Agglomeration

Median particle size passes QC while wafers still scratch. Here is why a ppm-level population of 1 to 10 micron agglomerates in CMP slurry drives scratch defects, and which measurements actually catch it.

The classical cyclone cut size model assumes discrete, non-agglomerating particles. Cohesive or moisture-sensitive fines can travel through a cyclone as agglomerates instead, which changes what a PSD result actually tells you about classifier performance.

The power or torque trace in high-shear wet granulation rises and plateaus as granules consolidate, but the signal is a supporting process indicator, not a direct particle size measurement, and its interpretation is bounded by batch size, impeller geometry, and formulation.

Powder wettability controls the first contact between powder and liquid. When liquid [...]

Sieve blinding does more than reduce screening capacity. It changes the [...]

vDeep-sea particle dynamics show powder engineering mechanics in powder dynamics. Deep trenches [...]

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Spray drying is a versatile industrial process that began in the early [...]

Powder Technology on a Grand Scale Powder technology plays a crucial [...]

Functional powder design plays a fundamental role in numerous industries. It [...]

In the field of agglomeration, exploring the intricacies of nucleation and [...]